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<article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:ali="http://www.niso.org/schemas/ali/1.0/" article-type="other" dtd-version="1.2" xml:lang="en"><front><journal-meta><journal-id journal-id-type="publisher-id">Frontier Materials &amp; Technologies</journal-id><journal-title-group><journal-title xml:lang="en">Frontier Materials &amp; Technologies</journal-title><trans-title-group xml:lang="ru"><trans-title>Frontier Materials &amp; Technologies</trans-title></trans-title-group></journal-title-group><issn publication-format="print">2782-4039</issn><issn publication-format="electronic">2782-6074</issn><publisher><publisher-name xml:lang="en">Togliatti State University</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="publisher-id">189</article-id><article-id pub-id-type="doi">10.18323/2073-5073-2017-4-46-51</article-id><article-categories><subj-group subj-group-type="toc-heading" xml:lang="en"><subject>Technical Sciences</subject></subj-group><subj-group subj-group-type="toc-heading" xml:lang="ru"><subject>Технические науки</subject></subj-group><subj-group subj-group-type="article-type"><subject></subject></subj-group></article-categories><title-group><article-title xml:lang="en">THE INFLUENCE OF DIFFUSION PROCESSES ON THE SURFACE SELF-ORGANIZATION IN THE MULTILAYER FILM COATING</article-title><trans-title-group xml:lang="ru"><trans-title>ВЛИЯНИЕ ДИФФУЗИОННЫХ ПРОЦЕССОВ НА САМООРГАНИЗАЦИЮ ПОВЕРХНОСТИ МНОГОСЛОЙНОГО ПЛЕНОЧНОГО ПОКРЫТИЯ</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author"><name-alternatives><name xml:lang="en"><surname>Kostyrko</surname><given-names>Sergey Alekseevich</given-names></name><name xml:lang="ru"><surname>Костырко</surname><given-names>Сергей Алексеевич</given-names></name></name-alternatives><address><country country="RU">Russian Federation</country></address><bio xml:lang="en"><p>PhD (Physics and Mathematics), Associate Professor</p></bio><bio xml:lang="ru"><p>кандидат физико-математических наук, доцент</p></bio><email>sergey.kostyrko@gmail.com</email><xref ref-type="aff" rid="aff1"/></contrib><contrib contrib-type="author"><name-alternatives><name xml:lang="en"><surname>Shuvalov</surname><given-names>Gleb Mikhailovich</given-names></name><name xml:lang="ru"><surname>Шувалов</surname><given-names>Глеб Михайлович</given-names></name></name-alternatives><address><country country="RU">Russian Federation</country></address><bio xml:lang="en"><p>postgraduate student</p></bio><bio xml:lang="ru"><p>аспирант</p></bio><email>shuvalov.gleb@gmail.com</email><xref ref-type="aff" rid="aff1"/></contrib></contrib-group><aff-alternatives id="aff1"><aff><institution xml:lang="en">St. Petersburg State University, St. Petersburg</institution></aff><aff><institution xml:lang="ru">Санкт-Петербургский государственный университет, Санкт-Петербург</institution></aff></aff-alternatives><pub-date date-type="pub" iso-8601-date="2017-12-29" publication-format="electronic"><day>29</day><month>12</month><year>2017</year></pub-date><issue>4</issue><issue-title xml:lang="en"/><issue-title xml:lang="ru"/><fpage>46</fpage><lpage>51</lpage><history><date date-type="received" iso-8601-date="2022-03-04"><day>04</day><month>03</month><year>2022</year></date><date date-type="accepted" iso-8601-date="2022-03-04"><day>04</day><month>03</month><year>2022</year></date></history><permissions><ali:free_to_read xmlns:ali="http://www.niso.org/schemas/ali/1.0/"/></permissions><self-uri xlink:href="https://vektornaukitech.ru/jour/article/view/189">https://vektornaukitech.ru/jour/article/view/189</self-uri><abstract xml:lang="en"><p>The multilayer film coatings are widely used in the electronic and optoelectronic industries. However, the technology of devices manufacturing requires that the number of defects should be kept to a minimum, otherwise, their operational properties will be poor. In recent years, it is assumed that the main cause of formation of defects within the film coatings is the formation of film surface relief. Surface roughness can be formed both during its depositing and post-heat treatment and during other phase transformations. The modeling of the process of thin-film coating surface self-organization will allow a better understanding of this phenomenon. The paper considers the 2D model of a solid body with a multilayer film coating. A small perturbation of film surface form is described by an arbitrary periodic function. Based on Gibbs thermodynamic approach, the authors got the evolutionary equation of film surface in combined action of surface diffusion determined by the derivative of chemical potential along the surface and the lattice diffusion associated with the stress alteration along the curved surface and capillary effect. Based on the initial approximation of perturbation method, the authors carried out the numerical analysis of morphological stability of flat form of multilayer film coating surface when affecting it with diffusion processes. The initial perturbation wavelength, the relative elasticity modules of the film system materials, the proportion of surface and lattice diffusion in the mass-transfer process, and the residual stresses were considered the key parameters of the task. The important feature of the study is that, by taking into account the lattice diffusion, the authors analyzed the influence of stress operator. It is proved that when increasing the lattice diffusion proportion, the relief is smoothed in case of tensions. For the compression forces, the lattice diffusion, as well as the surface diffusion, is the destabilizing process.     </p></abstract><trans-abstract xml:lang="ru"><p>Многослойные пленочные покрытия получили широкое применение в электронной и оптоэлектронной промышленности. Однако технология производства устройств требует, чтобы наличие дефектов в них было сведено к минимуму, в противном случае их рабочие свойства будут неудовлетворительными. В последние годы принято считать, что основной причиной образования дефектов в пленочных покрытиях является формирование рельефа поверхности пленки. Шероховатость поверхности пленки может образовываться как при ее осаждении и последующей термической обработке, так и при других фазовых превращениях. Моделирование процесса самоорганизации поверхности тонкопленочного покрытия позволит улучшить понимание данного явления. В статье рассмотрена двумерная модель твердого тела с многослойным пленочным покрытием. Малое возмущение формы поверхности пленки описывается произвольной периодической функцией. На основе термодинамического подхода Гиббса получено эволюционное уравнение поверхности пленки при комбинированном действии поверхностной диффузии, определяемой производной химического потенциала вдоль поверхности, и объемной диффузии, связанной с изменением напряжений вдоль криволинейной поверхности и капиллярным эффектом. На основе первого приближения метода возмущений проведен численный анализ морфологической устойчивости плоской формы поверхности двухслойного пленочного покрытия при действии диффузионных процессов. В качестве основных параметров задачи рассматривались длина волны начального возмущения, относительные модули упругости материалов пленочной системы, доля поверхностной и объемной диффузии в процессе массопереноса, остаточные напряжения. Важной особенностью представленного исследования является то, что посредством учета объемной диффузии был проведен анализ влияния знака напряжений. Было показано, что при увеличении доли объемной диффузии происходит сглаживание рельефа в случае растягивающих усилий. Для сжимающих усилий объемная диффузия, как и поверхностная, является дестабилизирующим процессом.</p></trans-abstract><kwd-group xml:lang="en"><kwd>thin-film coating</kwd><kwd>morphological stability</kwd><kwd>diffusion</kwd><kwd>stress concentration</kwd></kwd-group><kwd-group xml:lang="ru"><kwd>тонкопленочное покрытие</kwd><kwd>морфологическая устойчивость</kwd><kwd>диффузия</kwd><kwd>концентрация напряжений</kwd></kwd-group><funding-group><funding-statement xml:lang="ru">Работа выполнена при финансовой поддержке РФФИ, грант № 14-01-00260. 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